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LA140B-1-H-3 bảng dữ liệu(PDF) 5 Page - LIGITEK electronics co., ltd. |
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LA140B-1-H-3 bảng dữ liệu(HTML) 5 Page - LIGITEK electronics co., ltd. |
5 / 5 page MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 MIL-STD-202:103B JIS C 7021: B-11 MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2 This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. 1.T.Sol=260℃±5℃ 2.Dwell time= 10±1sec. 1.T.Sol=230℃±5℃ 2.Dwell time=5±1sec Solderability Test This test intended to see soldering well performed or not. 1.Ta=65℃±5℃ 2.RH=90%~95% 3.t=240hrs±2hrs 1.Ta=105℃±5℃&-40℃±5℃ (10min) (10min) 2.total 10 cycles Solder Resistance Test Thermal Shock Test High Temperature High Humidity Test The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. The purpose of this test is the resistance of the device under tropical for hous. PART NO. Page 4/4 JIS C 7021: B-12 MIL-STD-883:1008 JIS C 7021: B-10 MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 This test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. 1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) 1.Ta=-40℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) 1.Ta=105℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) Low Temperature Storage Test Operating Life Test High Temperature Storage Test The purpose of this is the resistance of the device which is laid under ondition of hogh temperature for hours. The purpose of this is the resistance of the device which is laid under condition of low temperature for hours. Test Condition Test Item Reliability Test: Description Reference Standard LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only LA140B-1/H-3 |
Số phần tương tự - LA140B-1-H-3 |
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Mô tả tương tự - LA140B-1-H-3 |
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