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MCP6V07 bảng dữ liệu(PDF) 6 Page - Microchip Technology |
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MCP6V07 bảng dữ liệu(HTML) 6 Page - Microchip Technology |
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6 / 44 page  MCP6V06/7/8 DS22093B-page 6 © 2008 Microchip Technology Inc. 1.3 Timing Diagrams FIGURE 1-1: Amplifier Start Up. FIGURE 1-2: Offset Correction Settling Time. FIGURE 1-3: Output Overdrive Recovery. FIGURE 1-4: Chip Select (MCP6V08). 1.4 Test Circuits The circuits used for the DC and AC tests are shown in Figure 1-5 and Figure 1-6. Lay the bypass capacitors out as discussed in Section 4.3.8 “Supply Bypassing and Filtering”. RN is equal to the parallel combination of RF and RG to minimize bias current effects. FIGURE 1-5: AC and DC Test Circuit for Most Non-Inverting Gain Conditions. FIGURE 1-6: AC and DC Test Circuit for Most Inverting Gain Conditions. The circuit in Figure 1-7 tests the op amp input’s dynamic behavior (i.e., IMD, tSTR, tSTL and tODR). The potentiometer balances the resistor network (VOUT should equal VREF at DC). The op amp’s common mode input voltage is VCM =VIN/2. The error at the input (VERR) appears at VOUT with a noise gain of 10 V/V. FIGURE 1-7: Test Circuit for Dynamic Input Behavior. VDD VOS VOS +50µV VOS –50µV tSTR 0V 1.8V to 5.5V 1.8V VIN VOS VOS +50µV VOS +50µV tSTL VIN VOUT VDD VSS tODR tODR VDD/2 VIL High-Z tON VIH CS tOFF VOUT -2 µA High-Z ISS -2 µA 300 µA 1µA IDD 1µA 300 µA VDD/5 MΩ ICS VDD/5 MΩ 5pA (typical) (typical) (typical) (typical) (typical) (typical) (typical) (typical) (typical) VDD MCP6V0X RG RF RN VOUT VIN VDD/3 1µF CL RL VL 100 nF RISO VDD MCP6V0X RG RF RN VOUT VDD/3 VIN 1µF CL RL VL 100 nF RISO VDD MCP6V0X VOUT 1µF CL RL VL 100 nF RISO 20.0 k Ω 24.9 Ω 20.0 k Ω 50 Ω VIN VREF 0.1% 0.1% 25 turn 20.0 k Ω 20.0 k Ω 0.1% 0.1% |
Số phần tương tự - MCP6V07 |
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Mô tả tương tự - MCP6V07 |
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