công cụ tìm kiếm bảng dữ liệu linh kiện điện tử
  Vietnamese  ▼
ALLDATASHEET.VN

X  

SN74ABT18640 bảng dữ liệu(PDF) 5 Page - Texas Instruments

Click here to check the latest version.
tên linh kiện SN74ABT18640
Giải thích chi tiết về linh kiện  SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS
Download  30 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
nhà sản xuất  TI [Texas Instruments]
Trang chủ  http://www.ti.com
Logo TI - Texas Instruments

SN74ABT18640 bảng dữ liệu(HTML) 5 Page - Texas Instruments

  SN74ABT18640 Datasheet HTML 1Page - Texas Instruments SN74ABT18640 Datasheet HTML 2Page - Texas Instruments SN74ABT18640 Datasheet HTML 3Page - Texas Instruments SN74ABT18640 Datasheet HTML 4Page - Texas Instruments SN74ABT18640 Datasheet HTML 5Page - Texas Instruments SN74ABT18640 Datasheet HTML 6Page - Texas Instruments SN74ABT18640 Datasheet HTML 7Page - Texas Instruments SN74ABT18640 Datasheet HTML 8Page - Texas Instruments SN74ABT18640 Datasheet HTML 9Page - Texas Instruments Next Button
Zoom Inzoom in Zoom Outzoom out
 5 / 30 page
background image
SN54ABT18640, SN74ABT18640
SCAN TEST DEVICES
WITH 18-BIT INVERTING BUS TRANSCEIVERS
SCBS267C – FEBRUARY 1994 – REVISED JULY 1996
5
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
test architecture
Serial-test information is conveyed by means of a 4-wire test bus or TAP, that conforms to IEEE Standard
1149.1-1990. Test instructions, test data, and test control signals all are passed along this serial-test bus. The
TAP controller monitors two signals from the test bus, TCK and TMS. The TAP controller extracts the
synchronization (TCK) and state control (TMS) signals from the test bus and generates the appropriate on-chip
control signals for the test structures in the device. Figure 1 shows the TAP-controller state diagram.
The TAP controller is fully synchronous to the TCK signal. Input data is captured on the rising edge of TCK and
output data changes on the falling edge of TCK. This scheme ensures data to be captured is valid for fully
one-half of the TCK cycle.
The functional block diagram shows the IEEE Standard 1149.1-1990 4-wire test bus and boundary-scan
architecture and the relationship among the test bus, the TAP controller, and the test registers. As shown, the
device contains an 8-bit instruction register and four test-data registers: a 44-bit boundary-scan register, a 3-bit
boundary-control register, a 1-bit bypass register, and a 32-bit device-identification register.
Test-Logic-Reset
Run-Test/Idle
Select-DR-Scan
Capture-DR
Shift-DR
Exit1-DR
Pause-DR
Update-DR
TMS = L
TMS = L
TMS = H
TMS = L
TMS = H
TMS = H
TMS = L
TMS = H
TMS = L
TMS = L
TMS = H
TMS = L
Exit2-DR
Select-IR-Scan
Capture-IR
Shift-IR
Exit1-IR
Pause-IR
Update-IR
TMS = L
TMS = L
TMS = H
TMS = L
TMS = H
TMS = H
TMS = L
TMS = H
TMS = L
Exit2-IR
TMS = L
TMS = H
TMS = H
TMS = H
TMS = L
TMS = H
TMS = L
TMS = H
TMS = H
TMS = H
TMS = L
Figure 1. TAP-Controller State Diagram


Số phần tương tự - SN74ABT18640

nhà sản xuấttên linh kiệnbảng dữ liệuGiải thích chi tiết về linh kiện
logo
Texas Instruments
SN74ABT18646 TI-SN74ABT18646 Datasheet
208Kb / 13P
[Old version datasheet]   WITH 18-BIT TRANSCEIVER AND REGISTER
SN74ABT18646PM TI-SN74ABT18646PM Datasheet
208Kb / 13P
[Old version datasheet]   WITH 18-BIT TRANSCEIVER AND REGISTER
SN74ABT18646PMG4 TI-SN74ABT18646PMG4 Datasheet
208Kb / 13P
[Old version datasheet]   WITH 18-BIT TRANSCEIVER AND REGISTER
More results

Mô tả tương tự - SN74ABT18640

nhà sản xuấttên linh kiệnbảng dữ liệuGiải thích chi tiết về linh kiện
logo
Texas Instruments
SN54ABT18245A TI-SN54ABT18245A Datasheet
357Kb / 28P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS
SN54ABT18245A TI-SN54ABT18245A_06 Datasheet
436Kb / 32P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS
SN54ABT18245A TI-SN54ABT18245A_08 Datasheet
617Kb / 34P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS
SN54ABTH18502A TI-SN54ABTH18502A_08 Datasheet
832Kb / 42P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SN54ABTH18502A TI-SN54ABTH18502A Datasheet
549Kb / 37P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SN54ABTH18502A TI-SN54ABTH18502A_07 Datasheet
802Kb / 42P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
74ABTH182652APMG4 TI1-74ABTH182652APMG4 Datasheet
580Kb / 39P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS
SN54ABTH18652A TI-SN54ABTH18652A Datasheet
575Kb / 37P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS
SN54ABT18652 TI-SN54ABT18652 Datasheet
169Kb / 11P
[Old version datasheet]   SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS
SN54ABT18245 TI1-SN54ABT18245 Datasheet
435Kb / 30P
[Old version datasheet]   SCAN TEST DEVICE WITH 18-BIT BUS TRANSCEIVERS
More results


Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30


bảng dữ liệu tải về

Go To PDF Page


Link URL




Chính sách bảo mật
ALLDATASHEET.VN
Cho đến nay ALLDATASHEET có giúp ích cho doanh nghiệp của bạn hay không?  [ DONATE ] 

Alldatasheet là   |   Quảng cáo   |   Liên lạc với chúng tôi   |   Chính sách bảo mật   |   Trao đổi link   |   Tìm kiếm theo nhà sản xuất
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com