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ADS8512IDW bảng dữ liệu(PDF) 3 Page - Texas Instruments

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Giải thích chi tiết về linh kiện  12-Bit, 40-kSPS, Low Power Sampling ANALOG-TO-DIGITAL CONVERTER with Internal Reference and Serial Interface
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ADS8512
www.ti.com ...................................................................................................................................................................................................... SLAS485 – JUNE 2008
ELECTRICAL CHARACTERISTICS (continued)
At TA = -40°C to +85°C, fS = 40 kHz, VS = 5 V, and using internal reference and fixed resistors, unless otherwise specified.
ADS8512I
ADS8512IB
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
MIN
TYP
MAX
UNIT
DC ACCURACY
INL
Integral linearity error
–1
±0.1
1
–0.5
±0.1
0.5
LSB(1)
DNL
Differential linearity error
–1
±0.1
1
–0.5
±0.1
0.5
LSB
No missing codes
12
12
Bits
Transition noise(2)
0.05
0.05
LSB
Gain error
±0.2
±0.1
%
Full scale error(3)(4)
-0.5
0.5
–0.25
0.25
%
Full scale error drift
±10
±10
ppm/°C
Full scale error(3)(4)
External 2.5-V reference
–0.5
0.5
–0.25
0.25
%
Full scale error drift
External 2.5-V reference
±0.5
±0.5
ppm/°C
Bipolar zero error(3)
Bipolar ranges
–10
10
–5
5
mV
Bipolar zero error drift
Bipolar ranges
±2
±2
ppm/°C
Unipolar zero error(3)
Unipolar ranges
–6
6
–6
6
mV
Unipolar zero error drift
Unipolar ranges
±3
±3
ppm/°C
Recovery time to rated accuracy from
1-
µF capacitor to CAP
300
300
µs
power down(5)
Power-supply sensitivity
+4.75 V < VS < +5.25 V
±0.75
±0.75
LSB
AC ACCURACY
SFDR
Spurious-free dynamic range
fIN = 1 kHz, ±10 V
80
98
80
98
dB(6)
THD
Total harmonic distortion
fIN = 1 kHz, ±10 V
–96
–80
–98
–80
dB
fIN = 1 kHz, ±10 V
70
74
72
74
SINAD
Signal-to-(noise+distortion)
dB
–60 dB input
30
32
SNR
Signal-to-noise
fIN = 1 kHz, ±10 V
70
74
72
74
dB
Usable bandwidth(7)
130
130
kHz
Full-power bandwidth (–3 dB)
600
600
kHz
SAMPLING DYNAMICS
Aperture delay
40
40
ns
Aperture jitter
20
20
ps
Transient response
FS step
5
5
µs
Overvoltage recovery(8)
750
750
ns
REFERENCE
Internal reference voltage
No load
2.48
2.5
2.52
2.48
2.5
2.52
V
Internal reference source current (must
1
1
µA
use external buffer)
Internal reference drift
8
8
ppm/°C
External reference voltage range for
2.3
2.5
2.7
2.3
2.5
2.7
V
specified linearity
External reference current drain
External 2.5-V reference
100
100
µA
(1)
LSB means least significant bit. 1 LSB for the ±10 V input range is 305
µV.
(2)
Typical rms noise at worst-case transitions.
(3)
As measured with fixed resistors. Adjustable to zero with external potentiometer.
(4)
Full-scale error is the worst case of –Full Scale or +Full Scale deviation from ideal first and last code transitions, divided by the full-scale
range; includes the effect of offset error. Tested at –40°C to +85°C.
(5)
Time delay after the ADS8512 is brought out of Power-Down mode until all internal settling occurs and the analog input is acquired to
rated accuracy. A Convert command after this delay yields accurate results.
(6)
All specifications in dB are referred to a full-scale input.
(7)
Usable bandwidth defined as full-scale input frequency at which Signal-to-(Noise + Distortion) degrades to 60 dB.
(8)
Recovers to specified performance after 2 x FS input overvoltage.
Copyright © 2008, Texas Instruments Incorporated
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