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1 / 39 page SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS165C – AUGUST 1993 – REVISED JULY 1996 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus ™ Family D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D UBT ™ (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode D Bus Hold on Data Inputs Eliminates the Need for External Pullup Resistors D B-Port Outputs of ’ABTH182504A Devices Have Equivalent 25- Ω Series Resistors, So No External Resistors Are Required D State-of-the-Art EPIC-ΙΙB ™ BiCMOS Design D One Boundary-Scan Cell Per I/O Architecture Improves Scan Efficiency D SCOPE ™ Instruction Set – IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ – Parallel-Signature Analysis at Inputs – Pseudo-Random Pattern Generation From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Device Identification – Even-Parity Opcodes D Packaged in 64-Pin Plastic Thin Quad Flat (PM) Packages Using 0.5-mm Center-to-Center Spacings and 68-Pin Ceramic Quad Flat (HV) Packages Using 25-mil Center-to-Center Spacings B5 B6 B7 GND B8 B9 B10 VCC NC B11 B12 B13 B14 GND B15 B16 B17 A4 A5 A6 GND A7 A8 A9 A10 NC VCC A11 A12 A13 GND A14 A15 A16 60 59 58 57 56 55 54 53 52 51 50 49 48 47 46 45 44 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 28 29 30 31 32 33 34 87 6 5 4 93 1 68 67 2 35 36 37 38 39 66 65 27 64 63 62 61 40 41 42 43 SN54ABTH18504A, SN54ABTH182504A . . . HV PACKAGE (TOP VIEW) NC – No internal connection Copyright © 1996, Texas Instruments Incorporated UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE, Widebus, UBT, and EPIC- ΙΙB are trademarks of Texas Instruments Incorporated. On products compliant to MIL-PRF-38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters. |
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