SM5330A

SEIKO NPC CORPORATION —11

DAC Characteristics

Test Level

The definition of “Test Level” shown in the electric characteristic table is as follows.

I : 100% of products tested at Ta = + 25

°C.

II : Guaranteed as result of design and characteristics evaluation.

Measurement Circuit

Parameter

Symbol

Condition

Rating

Unit

Test

level

min

typ

max

Differential linearity

DLE

DAC_0, DAC_1,

−1

0

+1

LSB

I

DAC HIGH-level output voltage

DAC_0, DAC_1, DAC0 = DAC1 = FFh

4.30

4.45

4.60

V

I

DAC LOW-level output voltage

DAC_0, DAC_1, DAC0 = DAC1 = 00h

0.25

0.35

0.45

V

I

DAC output current

DAC0 = DAC1 = FFh

–0.5

−

+0.5

mA

I

Note. This is a circuit only for the evaluation board of an electric characteristics. (It is not a recommended application circuit.)

– 1, n = 1 to 255

YOUT

GND

OUT_3

VCC

GND

VCC

OUT_2

GND

OUT_1

VCC

VCCD

I/O_0

IN1_L1

IN1_L2

IIN1_L3

IN1_SW

IN2_1

IN2_2

IN2_3

VCC

IN2_L1

IN2_L2

IN2_L3

IN2_SW

IN2_Y

IN2_PB

IN2_PR

IN1_SW

IN1_L3

IN1_L2

IN1_L1

1

µF

1

µF

1

µF

IN2_L1

IN2_L2

IN2_L3

IN2_SW

IN3_Y

IN3_PB

IN3_PR

1

µF

1

µF

1

µF

IN4_Y

IN4_PB

IN4_PR

1

µF

1

µF

1

µF

IN1_Y

IN1_PB

IN1_PR

1

µF

1

µF

1

µF

0

Ω

1000

µF

0

Ω

1000

µF

0

Ω

1000

µF

OUT_PB

OUT_PR

OUT_Y

I/O_0

I/O_1

SCL

SDA

DAC_1

DAC_0

YOUT

VDD VCC