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SM5022B1AH bảng dữ liệu(PDF) 5 Page - Nippon Precision Circuits Inc |
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SM5022B1AH bảng dữ liệu(HTML) 5 Page - Nippon Precision Circuits Inc |
5 / 11 page SM5022 series SEIKO NPC CORPORATION —5 Electrical Characteristics 3V operation: A ×A series VDD = 2.7 to 3.6V, VSS = 0V, Ta = − 20 to + 80°C unless otherwise noted. 5V operation: A ×A, B×A series VDD = 4.5 to 5.5V, VSS = 0V, Ta = − 20 to + 80°C unless otherwise noted. Parameter Symbol Condition Rating Unit min typ max HIGH-level output voltage VOH Q: Measurement cct 1, VDD = 2.7V, IOH = 4mA 2.1 2.4 – V LOW-level output voltage VOL Q: Measurement cct 2, VDD = 2.7V, IOL = 4mA – 0.3 0.4 V HIGH-level input voltage VIH INHN 2.0 – – V LOW-level input voltage VIL INHN – – 0.5 V Output leakage current IZ Q: Measurement cct 2, VDD = 3.6V, INHN = LOW, VOH = VDD –– 10 µA Q: Measurement cct 2, VDD = 3.6V, INHN = LOW, VOL = VSS –– 10 Current consumption IDD 30MHz crystal oscillator, measurement cct 3, load cct 1, INHN = open, CL = 15pF –47 mA INHN pull-up resistance RUP Measurement cct 4 25 100 250 k Ω Feedback resistance Rf Measurement cct 5 200 600 1000 k Ω Built-in capacitance CG Design value. A monitor pattern on a wafer is tested. SM5022A1AH, CF5022A1A SM5022A3AH, CF5022A3A SM5022A5AH, CF5022A5A SM5022A7AH, CF5022A7A 7.44 8 8.56 pF CD 9.3 10 10.7 pF Parameter Symbol Condition Rating Unit min typ max HIGH-level output voltage VOH Q: Measurement cct 1, VDD = 4.5V, IOH = 8mA 3.9 4.2 – V LOW-level output voltage VOL Q: Measurement cct 2, VDD = 4.5V, IOL = 8mA – 0.3 0.4 V HIGH-level input voltage VIH INHN 2.0 – – V LOW-level input voltage VIL INHN – – 0.8 V Output leakage current IZ Q: Measurement cct 2, VDD = 5.5V, INHN = LOW, VOH = VDD –– 10 µA Q: Measurement cct 2, VDD = 5.5V, INHN = LOW, VOL = VSS –– 10 Current consumption IDD 30MHz crystal oscillator, measurement cct 3, load cct 1, INHN = open, CL = 15pF SM5022A ×AH, CF5022A×A– 7 12 mA 30MHz crystal oscillator, measurement cct 3, load cct 2, INHN = open, CL = 15pF SM5022B ×AH, CF5022B×A– 7 12 INHN pull-up resistance RUP Measurement cct 4 25 100 250 k Ω Feedback resistance Rf Measurement cct 5 200 600 1000 k Ω Built-in capacitance CG Design value. A monitor pattern on a wafer is tested. SM5022A1AH, CF5022A1A SM5022A3AH, CF5022A3A SM5022A5AH, CF5022A5A SM5022A7AH, CF5022A7A SM5022B1AH, CF5022B1A 7.44 8 8.56 pF CD 9.3 10 10.7 pF |
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