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DAC8820ICDBG4 bảng dữ liệu(PDF) 1 Page - Texas Instruments |
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DAC8820ICDBG4 bảng dữ liệu(HTML) 1 Page - Texas Instruments |
1 / 22 page BurrBrown Products from Texas Instruments DAC8820 FEATURES APPLICATIONS DESCRIPTION R2 R1 DAC ParallelBus Input Register Control Logic DAC Register D15 WR D0 RST LDAC REF R COM R1 R FB R OFS R FB R OFS V DD I OUT AGND DGND DAC8820 DAC8820 SBAS358C – AUGUST 2005 – REVISED JUNE 2006 16-Bit, Parallel Input Multiplying Digital-to-Analog Converter • Automatic Test Equipment • ±0.5 LSB DNL • Instrumentation • ±1 LSB INL • Digitally Controlled Calibration • 16-Bit Monotonic • Industrial Control PLCs • Low Noise: 10 nV/ √Hz • Low Power: IDD = 2 µA • Analog Power Supply: +2.7 V to +5.5 V The DAC8820, a multiplying digital-to-analog • 1.66 mA Full-Scale Current, converter (DAC), is designed to operate from a with VREF = 10 V single 2.7 V to 5.5 V supply. • Settling Time: 0.5 µs The applied external reference input voltage VREF • 4-Quadrant Multiplying Reference determines the full-scale output current. An internal feedback resistor (RFB) provides temperature • Reference Bandwidth: 8 MHz tracking for the full-scale output when combined with • Reference Input: ±15 V an external, current-to-voltage (I/V) precision • Reference Dynamics: –105 THD amplifier. • SSOP-28 Package A parallel interface offers high-speed • Industry-Standard Pin Configuration communications. The DAC8820 is packaged in a space-saving SSOP-28 package and has an industry-standard pinout. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. All trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Copyright © 2005–2006, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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