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MC145011ED bảng dữ liệu(PDF) 4 Page - Freescale Semiconductor, Inc

tên linh kiện MC145011ED
Giải thích chi tiết về linh kiện  Photoelectric Smoke Detector IC with I/O For Line-Powered Applications
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nhà sản xuất  FREESCALE [Freescale Semiconductor, Inc]
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MC145011ED bảng dữ liệu(HTML) 4 Page - Freescale Semiconductor, Inc

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Sensors
4
Freescale Semiconductor
MC145011
Table 3. AC Electrical Characteristics
(Reference Timing Diagram Figure 6 and Figure 7) (TA = 25°C, VDD = 9.0 V, Component Values from Figure 8: R1 = 100.0 KΩ,
C3 = 1500.0 pF, R2 = 10.0 M
Ω)
No.
Characteristic
Symbol
Test Condition
Min
Max
Unit
1
Oscillator Period(1)
1. Oscillator period T (= TR + TF) is determined by the external components R1, R2, and C3 where TR = (0.6931) R2 C3 and
TF = (0.6931) R1 C3. The other timing characteristics are some multiple of the oscillator timing as shown in the table.
1/fOSC
Free-Running Sawtooth
Measured at Pin 12
9.5
11.5
ms
2
LED Status
tLED
No Local Smoke, and
No Remote Smoke
Illuminated
3
Remote Smoke, but
No Local Smoke
Illuminated
4
Local Smoke or Push
button Test
Extinguished
5
STROBE Pulse Width
tW(STB)
9.5
11.5
ms
6
IRED Pulse Period
tIRED
Smoke Test
9.67
11.83
s
7
Chamber Sensitivity Test,
without Local Smoke
38.9
47.1
8
Push button Test
0.302
0.370
9
IRED Pulse Width
tw(IRED)
94
116
µs
10
IRED Rise Time
tR
30
µs
IRED Fall Time
tF
200
11
SILVER and BRASS Modulation Period
tMOD
Local or Remote Smoke
297
363
ms
11, 12
SILVER and BRASS Duty Cycle
tON/tMOD
Local or Remote Smoke
73
77
%
13
SILVER and BRASS Chirp Pulse Period
tCH
Low Supply or Degraded
Chamber Sensitivity
38.9
47.1
s
14
SILVER and BRASS Chirp Pulse Width
tW(CH)
Low Supply or Degraded
Chamber Sensitivity
9.5
11.5
ms
15
Rising Edge on I/O to Smoke Alarm Response Time
tRR
Remote Smoke,
No Local Smoke
800
ms
16
Strobe Pulse Period
tSTB
Smoke Test
9.67
11.83
s
17
Chamber Sensitivity Test,
without Local Smoke
38.9
47.1
18
Low Supply Test,
without Local Smoke
38.9
47.1
19
Push button Test
0.302
0.370
Table 4. Pin Description
Pin No.
Pin Name
Description
1
C1
A capacitor connected to this pin as shown in Figure 8. determines the gain of the on-chip photo amplifier during push
button test and chamber sensitivity test (high gain). The capacitor value is chosen such that the alarm is tripped from
background reflections in the chamber during push button test.
Av ≈ 1 + (C1/10) where C1 is in pF. CAUTION: The value of the closed-loop gain should not exceed 10,000.
2
C2
A capacitor connected to this pin as shown in Figure 8. determines the gain of the on-chip photo amplifier except during
push button or chamber sensitivity tests.
Av ≈ 1 + (C2/10) where C2 is in pF. This gain increases about 10% during the IRED pulse, after two consecutive local
smoke detections.
Resistor R14 must be installed in series with C2. R14
≈ [1/(12√C2)] - 680 where R14 is in ohms and C2 is in farads.
3
DETECT
This input to the high-gain pulse amplifier is tied to the cathode of an external photodiode. The photodiode should have
low capacitance and low dark leakage current. The diode must be shunted by a load resistor and is operated at zero
bias.
The Detect input must be ac/dc decoupled from all other signals, VDD, and VSS. Lead length and/or foil traces to this
pin must be minimized, also. See Figure 9.


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