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MC100LVE164FAG bảng dữ liệu(PDF) 4 Page - ON Semiconductor |
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MC100LVE164FAG bảng dữ liệu(HTML) 4 Page - ON Semiconductor |
4 / 7 page MC100LVE164 http://onsemi.com 4 Table 5. LVNECL DC CHARACTERISTICS VCC = 0.0 V; VEE = −3.3 V (Note 3) Symbol Characteristic −40°C 25°C 85°C Unit Min Typ Max Min Typ Max Min Typ Max IEE Power Supply Current 34 45 34 45 37 45 mA VOH Output HIGH Voltage (Note 4) −1085 −1005 −880 −1025 −955 −880 −1025 −955 −880 mV VOL Output LOW Voltage (Note 4) −1830 −1695 −1555 −1810 −1705 −1620 −1810 −1705 −1620 mV VIH Input HIGH Voltage (Single−Ended) −1165 −880 −1165 −880 −1165 −880 mV VIL Input LOW Voltage (Single−Ended) −1810 −1475 −1810 −1475 −1810 −1475 mV IIH Input HIGH Current 150 150 150 μA IIL Input LOW Current 0.5 0.5 0.5 μA NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 3. Input and output parameters vary 1:1 with VCC. VEE can vary ±0.3 V. 4. Outputs are terminated through a 50 W resistor to VCC − 2.0 V. Table 6. AC CHARACTERISTICS VCC = 3.3 V; VEE = 0.0 V or VCC = 0.0 V; VEE = −3.3 V (Note 5) Symbol Characteristic −40°C 25°C 85°C Unit Min Typ Max Min Typ Max Min Typ Max fmax Maximum Toggle Frequency 700 700 700 MHz tPLH tPHL Propagation Delay A Input to Output SEL0 SEL1 SEL2 SEL3 350 500 400 400 400 600 700 675 675 550 850 900 900 900 700 350 500 400 400 400 600 700 675 675 550 850 900 900 900 700 350 500 400 400 400 600 700 675 675 550 850 900 900 900 700 ps tSKEW Within Device Skew (Note 6) 75 50 50 ps tJITTER RMS Random Clock Jitter <1 <1 <1 ps tr tf Rise/Fall Times (20% − 80%) 275 400 550 275 400 550 275 400 550 ps NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 5. VEE can vary ±0.3 V. 6. Within Device skew is defined as the difference in the A to Q delay between the 16 different A inputs. |
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