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MC145010 bảng dữ liệu(PDF) 6 Page - Freescale Semiconductor, Inc |
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MC145010 bảng dữ liệu(HTML) 6 Page - Freescale Semiconductor, Inc |
6 / 12 page Sensors 6 Freescale Semiconductor MC145010 Figure 3. AC Characteristics vs. Supply Figure 4. AC Characteristics vs. Temperature Figure 5. RC Component Variation Overtemperature 16 TEST This input has an on-chip pull-down device and is used to manually invoke a test mode. The Push Button Test mode is initiated by a high level at pin 16 (usually depression of a S.P.S.T. normally-open push button switch to VDD). After one oscillator cycle, IRED pulses approximately every 336 ms, regardless of the presence of smoke. Additionally, the amplifier gain is increased by automatic selection of C1. Therefore, the background reflections in the smoke chamber may be interpreted as smoke, generating a simulated-smoke condition. After the second IRED pulse, a successful test activates the horn-driver and I/O circuits. The active I/O allows remote signaling for system testing. When the Push Button Test switch is released, the Test input returns to VSS due to the on-chip pull-down device. After one oscillator cycle, the amplifier gain returns to normal, thereby removing the simulated-smoke condition. After two additional IRED pulses, less than a second, the IC exits the alarm mode and returns to standby timing. Table 4. Pin Description (Continued) Pin Symbol Description Pulse width of IRED Period or pulse width of other parameters VDD, Power Supply Voltage (V) 1.02 0.98 0.96 1.00 1.04 6.0 7.0 8.0 9.0 10.0 12.0 11.0 Pulse width of IRED Period or pulse width of other parameters TA, Ambient Temperature (°C) -10 0 10 20 40 50 60 1.02 1.01 0.99 0.98 1.00 30 VDD = 9.0 V 10 M Ω Carbon composition 100 k Ω Metal Film 1500 pF Dipped MICA TA, Ambient Temperature (°C) -10 0 10 20 30 40 50 60 1.03 1.02 1.01 1.00 0.99 0.98 Note: These components were used to generate Figure 3. |
Số phần tương tự - MC145010 |
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Mô tả tương tự - MC145010 |
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