Philips Semiconductors

Product specification

74ABT853

8-bit transceiver with 9-bit parity checker/

generator and flag latch (3-State)

1995 Sep 06

4

RECOMMENDED OPERATING CONDITIONS

SYMBOL

PARAMETER

LIMITS

UNIT

MIN

MAX

DC supply voltage

4.5

5.5

V

Input voltage

0

V

High-level input voltage

2.0

V

Low-level input voltage

0.8

V

High-level output current

–32

mA

Low-level output current

64

mA

∆t/∆v

Input transition rise or fall rate

0

5

ns/V

Operating free-air temperature range

–40

+85

°C

DC ELECTRICAL CHARACTERISTICS

LIMITS

SYMBOL

PARAMETER

TEST CONDITIONS

to +85

°C

UNIT

Min

Typ

Max

Min

Max

Input clamp voltage

–0.9

–1.2

–1.2

V

2.5

3.5

2.5

V

High–level output voltage

All outputs except ERROR

3.0

4.0

3.0

V

2.0

2.6

2.0

V

Low-level output voltage

0.42

0.55

0.55

V

Input leakage

Control pins

±0.01

±1.0

±1.0

µA

current

Data pins

±5

±100

±100

µA

Power-off leakage current

±5.0

±100

±100

µA

Power-up/down 3-State

±5.0

±50

±50

µA

3-State output High current

5.0

50

50

µA

3-State output Low current

–5.0

–50

–50

µA

Output high leakage current

5.0

50

50

µA

–50

–100

–180

–50

–180

mA

0.5

250

250

µA

Quiescent supply current

25

38

38

mA

0.5

50

50

µA

Outputs enabled, one input at 3.4V,

0.5

1.5

1.5

mA

Additional supply current per

Outputs 3-State, one data input at 3.4V,

0.01

50

50

µA

Outputs 3-State, one enable input at 3.4V,

0.5

1.5

1.5

mA

NOTES:

1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.

2. This is the increase in supply current for each input at 3.4V.

transition time of up to 100

µsec is permitted. The ERROR output pin 10 is not included in this spec due to the open collector design.