MC74VHC1G03DTT1 datasheet(2/4 Pages) ETL

tên linh kiện	MC74VHC1G03DTT1

Giải thích chi tiết về linh kiện	2-Input NAND Gate with Open Drain Output

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MC74VHC1G03

RECOMMENDED OPERATING CONDITIONS

Symbol

Parameter

Min

Max

Unit

V CC

DC Supply Voltage

2.0

5.5

V

V IN

DC Input Voltage

0.0

5.5

V

V OUT

DC Output Voltage

0.0

7.0

V

T A

Operating Temperature Range

– 55

+ 125

°C

t r ,t f

Input Rise and Fall Time

V

CC = 3.3 ± 0.3 V

0

100

ns/V

V

CC = 5.0 ± 0.5 V

0

20

DEVICE JUNCTION TEMPERATURE VERSUS

TIME TO 0.1% BOND FAILURES

Junction

Time,

Temperature °C

Hours

Years

80

1,032,200

117.8

90

419,300

47.9

100

178,700

20.4

110

79,600

9.4

120

37,000

4.2

130

17,800

2.0

140

8,900

1.0

Figure 3. Failure Rate vs. Time

Junction Temperature

1

10

100

1000

MAXIMUM RATINGS

Symbol

Parameter

Value

Unit

V CC

DC Supply Voltage

– 0.5 to + 7.0

V

V IN

DC Input Voltage

– 0.5 to 7.0

V

V OUT

DC Output Voltage

V CC=0

– 0.5 to 7.0

V

High or Low State

–0.5 to V cc + 0.5

I IK

Input Diode Current

–20

mA

I OK

Output Diode Current

V

OUT < GND; V OUT > V CC

+20

mA

I OUT

DC Output Current, per Pin

+ 25

mA

I CC

DC Supply Current, V CC and GND

+50

mA

P D

Power dissipation in still air

SC–88A, TSOP–5

200

mW

θ

JA

Thermal resistance

SC–88A, TSOP–5

333

°C/W

T L

Lead Temperature, 1 mm from Case for 10 s

260

°C

T J

Junction Temperature Under Bias

+ 150

°C

T stg

Storage temperature

–65 to +150

°C

V ESD

ESD Withstand Voltage

Human Body Model (Note 2)

>2000

V

Machine Model (Note 3)

> 200

Charged Device Model (Note 4)

N/A

I LATCH–UP

Latch–Up Performance

Above V CC and Below GND at 125°C (Note 5)

± 500

mA

1. Maximum Ratings are those values beyond which damage to the device may occur. Exposure to these conditions or conditions

beyond those indicated may adversely affect device reliability. Functional operation under absolute–maximum–rated conditions is

not implied. Functional operation should be restricted to the Recommended Operating Conditions.

2. Tested to EIA/JESD22–A114–A

3. Tested to EIA/JESD22–A115–A

4. Tested to JESD22–C101–A

5. Tested to EIA/JESD78

TIME, YEARS

Số phần tương tự - MC74VHC1G03DTT1

nhà sản xuất	tên linh kiện	bảng dữ liệu	Giải thích chi tiết về linh kiện
List of Unclassifed Man...	MC74VHC1G03DTT1	190Kb / 4P	2-Input NAND Gate with Open Drain Output
ON Semiconductor	MC74VHC1G03DTT1	84Kb / 6P	Single 2?묲nput NOR Gate with Open Drain Output January, 2007 ??Rev. 14
	MC74VHC1G03DTT1G	84Kb / 6P	Single 2?묲nput NOR Gate with Open Drain Output January, 2007 ??Rev. 14
	MC74VHC1G03DTT1G	171Kb / 14P	Single 2-Input NOR Gate with Open Drain Output April, 2022 ??Rev. 17

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Mô tả tương tự - MC74VHC1G03DTT1

nhà sản xuất	tên linh kiện	bảng dữ liệu	Giải thích chi tiết về linh kiện
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ON Semiconductor	MC74VHC1G01	84Kb / 6P	Single 2-Input NAND Gate with Open Drain Output December, 2016 ??Rev. 16

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