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MC10124 bảng dữ liệu(PDF) 4 Page - ON Semiconductor |
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MC10124 bảng dữ liệu(HTML) 4 Page - ON Semiconductor |
4 / 7 page MC10124 3–85 MOTOROLA MECL Data DL122 — Rev 6 ELECTRICAL CHARACTERISTICS (continued) TEST VOLTAGE VALUES (Volts) (mA) @ Test Temperature VR VCC VEE II Iin –30 °C +2.40 +5.00 –5.2 –10 +1.0 +25 °C +2.40 +5.00 –5.2 –10 +1.0 +85 °C +2.40 +5.00 –5.2 –10 +1.0 Pin Under TEST VOLTAGE APPLIED TO PINS LISTED BELOW Gd Characteristic Symbol Under Test VR VCC VEE II Iin Gnd Negative Power Supply Drain Current IE 8 9 8 16 Positive Power Supply Drain Ct ICCH 9 9 8 16 pp y Current ICCL 9 9 8 5,6,7,10,11,16 Reverse Current IR 6 7 6 7 9 9 8 8 16 16 Forward Current IF 6 7 9 9 8 8 16 16 Input Breakdown Voltage BVin 6 7 9 9 8 8 6 7 5,7,10,11,16 6,16 Clamp Input Voltage VI 6 7 9 9 8 8 6 7 16 16 High Output Voltage VOH 1 3 9 9 8 8 16 16 Low Output Voltage VOL 1 3 9 9 8 8 16 16 High Threshold Voltage VOHA 1 3 9 9 8 8 16 16 Low Threshold Voltage VOLA 1 3 9 9 8 8 16 16 Switching Times (50 Ω Load) +7.0 V –3.2 V +2.0 V Propagation Delay (+3.5Vdc to 50%)1 t6+1+ t6–1– t7+1+ t7–1– t7+3– t7–3+ 1 1 1 1 3 3 9 9 9 9 9 9 8 8 8 8 8 8 16 16 16 16 16 16 Rise Time (20 to 80%) t1+ 1 9 8 16 Fall Time (20 to 80%) t1– 1 9 8 16 1. See switching time test circuit. Propagation delay for this circuit is specified from +1.5Vdc in to the 50% point on the output waveform. The +3.5Vdc is shown here because all logic and supply levels are shifted 2 volts positive. Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained. Outputs are terminated through a 50–ohm resistor to –2.0 volts. Test procedures are shown for only one gate. The other gates are tested in the same manner. |
Số phần tương tự - MC10124 |
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Mô tả tương tự - MC10124 |
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