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ISL21080
FN6934 Rev. 6.00
Page 8 of 21
Mar 26, 2018
Electrical Specifications (ISL21080-50 VOUT = 5.0V) VIN = 6.5V, TA = -40°C to +85°C, IOUT = 0, unless otherwise
specified. Boldface limits apply over the operating temperature range, -40°C to +85°C.
PARAMETER
SYMBOL
CONDITIONS
MIN
(Note 13)TYP
MAX
(Note 13)UNIT
Output Voltage
VOUT
5.0
V
VOUT Accuracy at TA = +25°C(Notes 8, 9)VOA
-0.2
+0.2
%
Output Voltage Temperature Coefficient
(Note 10)
TC VOUT
50
ppm/°C
Input Voltage Range
VIN
5.5
8.0
V
Supply Current
IIN
0.5
1.5
µA
Line Regulation
VOUT /VIN
5.5 V < VIN < 8.0V
80
350
µV/V
Load Regulation
VOUT/IOUT
Sourcing: 0mA
 IOUT  10mA
10
100
µV/mA
Sinking: -10mA
 IOUT 0mA
20
350
µV/mA
Short-Circuit Current
ISC
TA = +25°C, VOUT tied to GND
80
mA
Turn-On Settling Time
tR
VOUT = ±0.1% with no load
4
ms
Ripple Rejection
f = 120Hz
-40
dB
Output Voltage Noise
eN
0.1Hz
 f 10Hz
30
µVP-P
Broadband Voltage Noise
VN
10Hz
 f 1kHz
52
µVRMS
Noise Density
f = 1kHz
1.1
µV/
Hz
Thermal Hysteresis (Note 11)
VOUT/TA
TA = +165°C
100
ppm
Long Term Stability (Note 12)
VOUT/tTA = +25°C
50
ppm
NOTES:
8. Post-reflow drift for the ISL21080 devices will range from 100µV to 1.0mV based on experimental results with devices on FR4 double sided boards.
The design engineer must take this into account when considering the reference voltage after assembly.
9. Post-assembly X-ray inspection may also lead to permanent changes in device output voltage and should be minimized or avoided. Initial accuracy
can change 10mV or more under extreme radiation. Most inspection equipment will not affect the FGA reference voltage, but if X-ray inspection is
required, it is advisable to monitor the reference output voltage to verify excessive shift has not occurred.
10. Over the specified temperature range. Temperature coefficient is measured by the box method whereby the change in VOUT is divided by the
temperature range; in this case, -40°C to +85°C = +125°C.
11. Thermal Hysteresis is the change of VOUT measured at TA = +25°C after temperature cycling over a specified range, TA. VOUT is read initially at
TA = +25°C for the device under test. The device is temperature cycled and a second VOUT measurement is taken at +25°C. The difference between
the initial VOUT reading and the second VOUT reading is then expressed in ppm. For  TA = +125°C, the device under test is cycled from +25°C to
+85°C to -40°C to +25°C.
12. Long term drift is logarithmic in nature and diminishes over time. Drift after the first 1000 hours will be approximately 10ppm/
1khrs.
13. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits established by characterization
and are not production tested.


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