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4 / 20 page ISL21007 FN6326 Rev.12.00 Page 4 of 20 Jun 9, 2017 Absolute Voltage Ratings Thermal Information Storage Temperature Range. . . . . . . . . . . . . . . . . . . . . . . .-65°C to +150°C Max Voltage VIN to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to +6.5V Max Voltage VOUT to GND (10s) . . . . . . . . . . . . . . . . . . . . . -0.5V to VOUT + 1 Voltage on “DNC” pins . . . . . . . . . No connections permitted to these pins. ESD Rating Human Body Model (HBM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6kV Machine Model (MM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 600V Charged Device Model (CDM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2kV Environmental Operating Conditions X-Ray Exposure (Note 4) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10mRem Thermal Resistance (Typical, Note 5) JA (°C/W) 8 Ld SOIC. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 113.12 Continuous Power Dissipation (Note 5) . . . . . . . . . . . . . . . . . . . .TA = +70°C 8 Ld SOIC Derate 5.88mW/°C above +70°C. . . . . . . . . . . . . . . . . . 471mW Pb-Free Reflow Profile (Note 6). . . . . . . . . . . . . . . . . . . . . . . . . . . see TB493 Recommended Operating Conditions Temperature Range (Full Range Industrial) . . . . . . . . . . .-40°C to +125°C CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product reliability and result in failures not covered by warranty. IMPORTANT NOTE: All parameters having Min/Max specifications are guaranteed. Typ values are for information purposes only. Unless otherwise noted, all tests are at the specified temperature and are pulsed tests, therefore: TJ = TC = TA NOTES: 4. Measured with no filtering, distance of 10” from source, intensity set to 55kV and 70mA current, 30s duration. Other exposure levels should be analyzed for Output Voltage drift effects. See “Applications Information” on page 16. 5. JA is measured with the component mounted on a high-effective thermal conductivity test board in free air. See tech brief TB379 for details. 6. Post-reflow drift for the ISL21007 devices will range from 100µV to 1.0mV based on experimental results with devices on FR4 double sided boards. The design engineer must take this into account when considering the reference voltage after assembly. Common Electrical Specifications (ISL21007-12, -20, -25, -30) T A = -40°C to +125°C, unless otherwise specified. Boldface limits apply across the operating temperature range, -40°C to +125°C. PARAMETER SYMBOL CONDITIONS MIN (Note 10)TYP MAX (Note 10)UNIT VOUT Accuracy at TA = +25°C VOA ISL21007B -0.5 +0.5 mV ISL21007C -1.0 +1.0 mV ISL21007D -2.0 +2.0 mV Output Voltage Temperature Coefficient (Note 7) TC VOUT ISL21007B 3 ppm/°C ISL21007C 5 ppm/°C ISL21007D 10 ppm/°C Supply Current IIN 75 150 µA Trim Range ±2.0 ±2.5 % Turn-On Settling Time tR VOUT = ±0.1% 120 µs Ripple Rejection f = 10kHz 60 dB Output Voltage Noise eN 0.1Hz ≤ f ≤ 10Hz 4.5 µVP-P Broadband Voltage Noise VN 10Hz ≤ f ≤ 1kHz 2.2 µVRMS Noise Density f = 1kHz 60 nV/ Hz |
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