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ADS5220IRGZR bảng dữ liệu(PDF) 2 Page - Burr-Brown (TI)

[Old version datasheet] Texas Instruments acquired Burr-Brown Corporation.
tên linh kiện ADS5220IRGZR
Giải thích chi tiết về linh kiện  12-Bit, 40MSPS Sampling, 3.3V ANALOG-TO-DIGITAL CONVERTER
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nhà sản xuất  BURR-BROWN [Burr-Brown (TI)]
Trang chủ  http://www.burr-brown.com
Logo BURR-BROWN - Burr-Brown (TI)

ADS5220IRGZR bảng dữ liệu(HTML) 2 Page - Burr-Brown (TI)

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background image
ADS5220
2
SBAS261A
www.ti.com
SPECIFIED
PACKAGE
TEMPERATURE
PACKAGE
ORDERING
TRANSPORT
PRODUCT
PACKAGE-LEAD
DESIGNATOR(1)
RANGE
MARKING
NUMBER
MEDIA, QUANTITY
ADS5220
TQFP-48
PFB
–40
°C to +85°C
ADS5220PFB
ADS5220PFBT
Tape and Reel, 250
"
"
"
"
"
ADS5220IPFBR
Tape and Reel, 2000
ADS5220
QFN-48(2)
RGZ
–40
°C to +85°C
ADS5220RGZ
ADS5220RGZ
Rails, 52
"
"
"
"
"
ADS5220IRGZR
Tape and Reel, 1000
NOTE: (1) For the most current specifications and package information, refer to our web site at www.ti.com.
(2) This package available Q2 2004.
ADS5220
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNITS
ELECTROSTATIC
DISCHARGE SENSITIVITY
This integrated circuit can be damaged by ESD. Texas Instru-
ments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling
and installation procedures can cause damage.
ESD damage can range from subtle performance degradation
to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric
changes could cause the device not to meet its published
specifications.
AVDD, DVDD, VDRV ........................................................................... +3.8V
Analog Input ............................................................. –0.3V to (+VS + 0.3V)
Logic Input ............................................................... –0.3V to (+VS + 0.3V)
Case Temperature ......................................................................... +100
°C
Junction Temperature .................................................................... +150
°C
Storage Temperature ..................................................................... +150
°C
NOTE: (1) Stresses above these ratings may cause permanent damage.
Exposure to absolute maximum conditions for extended periods may degrade
device reliability.
ABSOLUTE MAXIMUM RATINGS(1)
PACKAGE/ORDERING INFORMATION
ELECTRICAL CHARACTERISTICS: AVDD = 3.3V
TMIN = –40°C, TMAX = +85°C, typical values are at TA = +25°C, sampling rate = 40MSPS, 50% clock duty cycle, AVDD = 3.3V, DVDD = 3.3, VDRV = 2.5V, –1dBFS, DCA
off, internal reference voltage, and 2VPP differential input, unless otherwise noted.
RESOLUTION
12 Tested
Bits
SPECIFIED TEMPERATURE RANGE
Ambient Air
–40 to +85
°C
ANALOG INPUT
Single-Ended Input Range
2VPP
0.5
2.5
V
Optional Single-Ended Input Range
1VPP
12
V
Differential Input Range
2VPP
12
V
Analog Input Bias Current
1
µA
Input Impedance
Static, No Clock
1.25 || 5
M
Ω || pF
Analog Input Bandwidth
–3dBFS Input
300
MHz
CONVERSION CHARACTERISTICS
Sample Rate
1M
40M
Samples/s
Data Latency
5
Clock Cycle
Clock Duty Cycle
Mode Select Enabled
35 to 65
%
DYNAMIC CHARACTERISTICS
Differential Linearity Error (largest code error)
f = 2.4MHz
±0.3
±0.75
LSB
f = 9.7MHz
±0.35
LSB
No Missing Codes
Tested
Integral Nonlinearity Error, f = 2.4MHz
±0.7
±1.5
LSBs
Spurious-Free Dynamic Range(1)
Referred to Full-Scale
f = 2.4MHz
88
dBFS(2)
f = 9.7MHz
83
88
dBFS
f = 19.8MHz
76
dBFS
2-Tone Intermodulation Distortion(3)
f = 9.5MHz and 10.5MHz (–7dB each tone)
86.3
dBc
Signal-to-Noise Ratio (SNR)
Referred to Full-Scale
f = 2.4MHz
70
dBFS
f = 9.7MHz
68.5
70
dBFS
f = 19.8MHz
69
dBFS
Signal-to-(Noise + Distortion) (SINAD)
Referred to Full-Scale
f = 2.4MHz
69
dBFS
f = 9.7MHz
68
69
dBFS
f = 19.8MHz
68
dBFS
Effective Number of Bits(4), f = 2.4MHz
11.2
Bits
Output Noise
Input Tied to Common-Mode
0.3
LSBrms
Aperture Delay Time
3ns
Aperture Jitter
1.2
ps rms
Over-Voltage Recovery Time
1.0
Clock Cycle
Full-Scale Step Acquisition Time
5ns


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