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AD568SQ bảng dữ liệu(PDF) 4 Page - Analog Devices |
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4 / 15 page AD568 REV. A –3– ORDERING GUIDE Linearity Voltage Temperature Error Max Gain T.C. Model l Package Option 2 Range C@ 25 C Max ppm/ C AD568JQ 24-Lead Cerdip (Q-24) 0 to +70 ±1/2 ±50 AD568KQ 24-Lead Cerdip (Q-24) 0 to +70 ±1/4 ±30 AD568SQ 24-Lead Cerdip (Q-24) –55 to +125 ±1/2 ±50 NOTES 1For details on grade and package offerings screened in accordance with MIL-STD-883, refer to the Analog Devices Military Products Databook or current AD568/883B data sheet. 2Q = Cerdip. Definitions LINEARITY ERROR (also called INTEGRAL NONLINEAR- ITY OR INL): Analog Devices defines linearity error as the maximum deviation of the actual analog output from the ideal output (a straight line drawn from 0 to FS) for any bit combina- tion expressed in multiples of 1 LSB. The AD568 is laser trimmed to 1/4 LSB (0.006% of FS) maximum linearity error at +25 °C for the K version and 1/2 LSB for the J and S versions. DIFFERENTIAL LINEARITY ERROR (also called DIFFER- ENTIAL NONLINEARITY or DNL): DNL is the measure of the variation in analog value, normalized to full scale, associated with a 1 LSB change in digital input code. Monotonic behavior WARNING! ESD SENSITIVE DEVICE CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD568 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. requires that the differential linearity error not exceed 1 LSB in the negative direction. MONOTONICITY: A DAC is said to be monotonic if the out- put either increases or remains constant as the digital input increases. UNIPOLAR OFFSET ERROR: The deviation of the analog output from the ideal (0 V or 0 mA) when the inputs are set to all 0s is called unipolar offset error. BIPOLAR OFFSET ERROR: The deviation of the analog out- put from the ideal (negative half-scale) when the inputs are set to all 0s is called bipolar offset error. 18 6 7 8 9 10 11 12 1 2 3 4 5 19 20 23 24 13 14 17 2X 4X MSB LSB PNP CURRENT SOURCES 1.4V BAND- GAP REF THRESHOLD CONTROL THRESHOLD COMMON LADDER COMMON PNP SWITCHES DIFFUSED R-2R LADDER (10 - 20 Ω) THIN-FILM R-2R LADDER (100 - 200 Ω) BIPOLAR CURRENT GENERATOR BURIED ZENER REFERENCE 21 22 200 Ω ANALOG COMMON V CC I OUT REFERENCE COMMON 1k Ω 15 16 LOAD RESISTOR (R L) BIPOLAR OFFSET (I BPO) 10V SPAN RESISTOR 10V SPAN RESISTOR I OUT I OUT AD568 V EE Figure 1. Functional Block Diagram ABSOLUTE MAXIMUM RATINGS 1 VCC to REFCOM . . . . . . . . . . . . . . . . . . . . . . . . 0 V to +18 V VEE to REFCOM . . . . . . . . . . . . . . . . . . . . . . . . . 0 V to –18 V REFCOM to LCOM . . . . . . . . . . . . . . . . . +100 mV to –10 V ACOM to LCOM . . . . . . . . . . . . . . . . . . . . . . . . . . . ±100 mV THCOM to LCOM . . . . . . . . . . . . . . . . . . . . . . . . . . ±500 mV SPANs to LCOM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±12 V IBPO to LCOM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 5 V IOUT to LCOM . . . . . . . . . . . . . . . . . . . . . . . . . . . –5 V to VTH Digital Inputs to THCOM . . . . . . . . . . . . . –500 mV to +7.0 V Voltage Across Span Resistor . . . . . . . . . . . . . . . . . . . . . . 12 V VTH to THCOM . . . . . . . . . . . . . . . . . . . . . . –0.7 V to +1.4 V Logic Threshold Control Input Current . . . . . . . . . . . . . 5 mA Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 mW Storage Temperature Range Q (Cerdip) Package . . . . . . . . . . . . . . . . . –65 °C to +150°C Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . 175 °C Thermal Resistance θ JA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75 °C/W θ JC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 °C/W 1Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. PIN CONFIGURATION |
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